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Volumn , Issue , 2002, Pages 365-368

High reliability of 0.07 μm Pseudomorphic InGaAs/InAlAs/InP HEMT MMICs on 3-inch InP substrates

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; AMPLIFIERS (ELECTRONIC); HIGH ELECTRON MOBILITY TRANSISTORS; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; STRESSES;

EID: 0036053493     PISSN: 10928669     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (12)
  • 10
    • 6444244380 scopus 로고    scopus 로고
    • High reliability of 0.1 μm InGaAs/InAlAs/InP high electron mobility transistors microwave monolithic integrated circuit on 3-inch inp substrates
    • (2002) Jpn. J. Appl. Physics , vol.41 , pp. 1-5
    • Chou, Y.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.