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Volumn , Issue , 2002, Pages 365-368
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High reliability of 0.07 μm Pseudomorphic InGaAs/InAlAs/InP HEMT MMICs on 3-inch InP substrates
a a a a a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVATION ENERGY;
AMPLIFIERS (ELECTRONIC);
HIGH ELECTRON MOBILITY TRANSISTORS;
SEMICONDUCTING INDIUM GALLIUM ARSENIDE;
SEMICONDUCTING INDIUM PHOSPHIDE;
STRESSES;
PSEUDOMORPHIC DEVICES;
MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;
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EID: 0036053493
PISSN: 10928669
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (10)
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References (12)
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