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Volumn 13, Issue 46, 2001, Pages 10477-10486

Theoretical study of direct-current and radio-frequency breakdown in GaN wurtzite- and zinc-blende-phase MESFETs (metal-semiconductor field-effect transistors)

(5) Farahmand, Maziar a Weber, Michael b Tirino, Louis b Brennan, Kevin F b Ruden, P Paul c

a Movaz Networks (United States)

b GEORGIA INSTITUTE OF TECHNOLOGY (United States)

c University of Minnesota (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRON TRANSITIONS; GALLIUM NITRIDE; IMPACT IONIZATION; MONTE CARLO METHODS;

DIRECT CURRENT BREAKDOWNS; ELECTRON HEATING; RADIO-FREQUENCY BREAKDOWNS;

MESFET DEVICES;

EID: 0035915021 PISSN: 09538984 EISSN: None Source Type: Journal
DOI: 10.1088/0953-8984/13/46/316 Document Type: Article

Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.