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Volumn 50, Issue 6, 2001, Pages 1475-1484
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IC fabrication-compatible processing for instrumentation and measurement applications
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Author keywords
Fabrication compatibility; Metrology; Microsystem machining; On chip cointegration
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Indexed keywords
HYBRID TECHNOLOGY;
MICROMACHINED DEVICES;
ON CHIP COINTEGRATION;
SOLID STATE SENSOR;
MEASUREMENTS;
MECHANICAL PROPERTIES;
MICROELECTROMECHANICAL DEVICES;
PHOTOLITHOGRAPHY;
SILICON SENSORS;
SOLID STATE DEVICES;
INTEGRATED CIRCUIT MANUFACTURE;
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EID: 0035722370
PISSN: 00189456
EISSN: None
Source Type: Journal
DOI: 10.1109/19.982931 Document Type: Article |
Times cited : (5)
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References (32)
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