메뉴 건너뛰기




Volumn 55, Issue 12, 2001, Pages 1676-1681

Use of near edge X-ray absorption fine structure spectromicroscopy to characterize multicomponent polymeric systems

Author keywords

Analysis; Composition; Microscopy; Near edge X ray absorption fine structure spectromicroscopy; NEXAFS; Polymers; X rays

Indexed keywords

CHARACTERIZATION; CHEMICAL ANALYSIS; COMPOSITION; MULTILAYERS; POLYMERS; X RAY MICROSCOPES;

EID: 0035701946     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702011954008     Document Type: Article
Times cited : (11)

References (36)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.