Faults in processor control subsystems: Testing correctness and performance faults in the data prefetching unit

Proceedings of the Asian Test Symposium

Volumn , Issue , 2001, Pages 319-324

  Almukhaizim, Sobeeh ^a   Petrov, Peter ^a   Orailoglu, Alex ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER STORAGE; COMPUTER CONTROL SYSTEMS; DATA ACQUISITION; DESIGN FOR TESTABILITY; FAULT TOLERANT COMPUTER SYSTEMS; SOFTWARE ENGINEERING;

DATA PREFETCHING UNIT; FUNCTIONAL TEST; PROCESSOR CONTROL SUBSYSTEMS;

INTEGRATED CIRCUIT TESTING;

EID: 0035699334     PISSN: 10817735     EISSN: None     Source Type: Journal    
DOI: 10.1109/ATS.2001.990303     Document Type: Article

References (15)

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