Performance test case generation for microprocessors

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1998, Pages 54-59

  Bose, P ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN FOR TESTABILITY; INTEGRATED CIRCUIT TESTING; PERFORMANCE; SPECIFICATIONS;

PERFORMANCE TEST CASES;

MICROPROCESSOR CHIPS;

EID: 0032313030     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)