IS-FPGA: A new symmetric FPGA architecture with implicit SCAN

IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 924-931

  Renovell, M ^a   Faure, P ^a   Portal, J M ^a   Figueras, J ^a   Zorian, Y ^a  

^a LIRMM   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; DATA STORAGE EQUIPMENT; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; SEQUENTIAL CIRCUITS;

LOGIC-INTERCONNECT INTERFACES; MANUFACTURING-ORIENTED TEST PROCEDURES;

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 0035687660     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)

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