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Volumn 196, Issue 1-6, 2001, Pages 17-31
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Analysis of the effects arising from the near-field optical microscopy of homogeneous dielectric slabs
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Author keywords
Computer simulation; Contrast mechanisms; FDTD; Finite difference time domain; Near field optical microscopy; SNOM
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Indexed keywords
COMPUTER SIMULATION;
FINITE DIFFERENCE METHOD;
LIGHT SOURCES;
NEAR FIELD SCANNING OPTICAL MICROSCOPY;
REFRACTIVE INDEX;
TIME DOMAIN ANALYSIS;
CONTRAST MECHANISMS;
DIELECTRIC MATERIALS;
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EID: 0035451407
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/S0030-4018(01)01400-6 Document Type: Article |
Times cited : (4)
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References (51)
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