SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 32, Issue 1, 2001, Pages 154-160

Ultrathin Al layers on Si(111) and Si(100): Structures and phase transitions

(3) Hale, Penny a Thurgate, Stephen a Wilkie, Peter a

a MURDOCH UNIVERSITY (Australia)

Author keywords

Aluminium; Clusters; LEED; MBE; RHEED; Silicon(111)

Indexed keywords

CRYSTAL ORIENTATION; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; MONOLAYERS; PHASE TRANSITIONS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING SILICON; THICK FILMS;

SCANNING FORCE MICROSCOPY (SFM);

ULTRATHIN FILMS;

EID: 0035420532 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1027 Document Type: Conference Paper

Times cited : (10)

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