Highly charged ion based time-of-flight emission microscope

Review of Scientific Instruments

Volumn 71, Issue 5, 2000, Pages 2077-2081

  Hamza, Alex V ^a   Barnes, Alan V ^a   Magee, Ed ^a   Newman, Mike ^a   Schenkel, Thomas ^a   McDonald, Joseph W ^a   Schneider, Dieter H ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000059723     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150582     Document Type: Article

References (16)

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