Luminescent layers for ion-photon emission microscopy

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 181, Issue 1-4, 2001, Pages 329-334

  Yang, C ^a   Doyle, B L ^b   Rossi, P ^c   Nigam, M ^a   El Bouanani, M ^a   Duggan, J L ^a   McDaniel, F D ^a  

^a UNIVERSITY OF NORTH TEXAS   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c SEZIONE DI PADOVA   (Italy)

Author keywords

IBICC; IBIL; Ion photon emission microscope; Luminescence; Phosphors; Scanning nuclear microprobe

Indexed keywords

CHARGED PARTICLES; ION BEAMS; ION MICROSCOPES; LUMINESCENCE; OPTICAL MICROSCOPY; PHOSPHORS; PHOTONIC PROPULSION; PROBES; SCINTILLATION; THIN FILMS;

ION BEAM INDUCED CHARGE COLLECTION (IBICC); ION BEAM INDUCED LUMINESCENCE (IBIL); ION PHOTON EMISSION MICROSCOPY (IPEM); SCANNING NUCLEAR MICROPROBE;

PLASTIC PRODUCTS;

EID: 0035388360     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00490-6     Document Type: Conference Paper

References (4)