Au "ink" for AFM "dip-pen" nanolithography

Langmuir

Volumn 17, Issue 9, 2001, Pages 2575-2578

  Maynor, Benjamin W ^a   Li, Yan ^a   Liu, Jie ^a  

^a DUKE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD EFFECTS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; SCANNING; SELF ASSEMBLY;

SCANNING PROBE LITHOGRAPHY;

GOLD;

EID: 0035353386     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la001755m     Document Type: Article

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