Stochastic interconnect modeling, power trends, and performance characterization of 3-D circuits

IEEE Transactions on Electron Devices

Volumn 48, Issue 4, 2001, Pages 638-652

  Zhang, Rongtian ^b   Roy, Kaushik ^a,b   Koh, Cheng Kok ^a,b   Janes, David B ^a,b  

^a IEEE   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

Interconnect modeling; Performance characterization; Power consumption; Repeaters; Technology generations; Technology planning; Three dimensional circuits

Indexed keywords

THREE-DIMENSIONAL CIRCUITS;

ELECTRIC POWER UTILIZATION; SEMICONDUCTOR DEVICE MODELS; STOCHASTIC PROGRAMMING; TELECOMMUNICATION REPEATERS;

LARGE SCALE SYSTEMS;

EID: 0035309202     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.915671     Document Type: Article

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