A stochastic wire-length distribution for gigascale integration (gsi)-part I: Derivation and validation

IEEE Transactions on Electron Devices

Volumn 45, Issue 3, 1998, Pages 580-589

  Davis, Jeffrey A ^a   De Vivek, K ^a   Meindl, James D ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Interconnect density function; Interconnect projections; Rent's rule; Stochastic system modeling; Wire length distribution

Indexed keywords

COMPUTATIONAL METHODS; INTERCONNECTION NETWORKS; MICROPROCESSOR CHIPS; RANDOM PROCESSES; SEMICONDUCTOR DEVICE MODELS;

GIGASCALE INTEGRATION (GSI); INTERCONNECT DENSITY FUNCTION; RENT'S RULE; WIRE LENGTH DISTRIBUTION;

VLSI CIRCUITS;

EID: 0032026510     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.661219     Document Type: Article

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