Space charge measurement in a dielectric material after irradiation with a 30 kV electron beam: Application to single-crystals oxide trapping properties

Review of Scientific Instruments

Volumn 70, Issue 7, 1999, Pages 3102-3112

  Vallayer, B ^a   Blaise, G ^b   Treheux, D ^a  

^a ECOLE CENTRALE DE LYON   (France)

^b UNIVERSITÉ PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000688309     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149887     Document Type: Article

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