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Volumn 20, Issue 3, 2001, Pages 402-415

Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams

Author keywords

Algorithm; ATPG; Data structure; HDL; RTL; Testing

Indexed keywords

ASSIGNMENT DECISION DIAGRAMS; AUTOMATIC TEST PATTERN GENERATION; REGISTER TRANSFER LEVEL CIRCUITS;

EID: 0035271698     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.913758     Document Type: Article
Times cited : (57)

References (39)
  • 34
    • 0005015913 scopus 로고    scopus 로고
    • Exploration environment tutorial
    • Y. Explorations, Inc., Irvine, CA
    • (1999)
  • 36
    • 0005036998 scopus 로고
    • Introduction to HDL-based design using VHDL
    • Synopsys Inc., Mountain View, CA
    • (1990)
    • Carlson, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.