On determining scan flip-flops in partial-scan designs

1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers

Volumn , Issue , 1990, Pages 322-325

  Lee, D H ^a   Reddy, S M ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC CIRCUITS, FLIP FLOP; MATHEMATICAL TECHNIQUES;

BENCHMARK CIRCUITS; PARTIAL SCANS; S-GRAPHS; SCAN FLIP-FLOPS;

LOGIC CIRCUITS, SEQUENTIAL;

EID: 0025561326     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)