TAO: Regular expression based high-level testability analysis and optimization

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 331-340

  Ravi, Srivaths ^a   Lakshminarayana, Ganesh ^a   Jha, Niraj K ^a  

^a PRINCETON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGEBRA; ALGORITHMS; BENCHMARKING; DESIGN FOR TESTABILITY; MATHEMATICAL MODELS; OPTIMIZATION;

REGISTER-TRANSFER LEVEL (RTL); TESTABILITY ANALYSIS AND OPTIMIZATION (TAO);

INTEGRATED CIRCUIT TESTING;

EID: 0032314037     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)