Test generation for gigahertz processors using an automatic functional constraint extractor

Proceedings - Design Automation Conference

Volumn , Issue , 1999, Pages 647-652

  Tupuri, Raghuram S ^a   Krishnamachary, Arun ^a   Abraham, Jacob A ^a  

^a Texas Microprocessor Div   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION;

AUTOMATIC FUNCTIONAL CONSTRAINT EXTRACTOR;

INTEGRATED CIRCUIT TESTING;

EID: 0032681050     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/309847.310018     Document Type: Conference Paper

References (8)