Coupled analysis of electromigration reliability and performance in ULSI signal nets

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 2001, Pages 158-164

  Banerjee, K ^a   Mehrotra, A ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC CONDUCTIVITY; ELECTROMIGRATION; THERMAL EFFECTS;

FINITE BARRIER METAL THICKNESS; JOULE HEATING;

ULSI CIRCUITS;

EID: 0035214951     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (29)

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