A Practical approach to static signal electromigration analysis

Proceedings - Design Automation Conference

Volumn , Issue , 1998, Pages 572-577

  Ns, Nagaraj ^a   Cano, Frank ^a   Haznedar, Haldun ^a   Young, Duane ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMIGRATION; MICROSTRIP LINES; SIGNAL ANALYSIS; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; CURRENT DENSITY; INTEGRATED CIRCUIT LAYOUT; MICROPROCESSOR CHIPS; PRESSURE EFFECTS;

CELL-BASED DESIGN; DYNAMIC CURRENT; ELECTROMIGRATION ANALYSIS; LARGE DESIGNS; PEAK CURRENTS; POSITIVE AND NEGATIVE CURRENTS; SIGNAL LINES;

COMPUTER AIDED DESIGN; ELECTROMIGRATION;

SIGNAL LINE SEGMENTS;

EID: 0031618666     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/277044.277195     Document Type: Conference Paper

References (10)

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4. Nagaraj NS, "Approximate computation of signal characteristics of on-chip interconnect." Proc. of ISCAS 1994.
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8. The National Technology Roadmap for Semiconductors, Semiconductor Industry Association (SIA), 1997.
9. "Design Needs for the 21st Century: White Paper, " Semiconductor Research Center (SRC), September, 1994.
10. Ting, L, May, J.S., Hunter, W.R., and McPherson, J.W., "AC Electromigration Characterization and Modeling of Multilayered Interconnections, " Proceedings of IRPS, pp. 311-316 1993.