Measurement of subtle strain modifications in heterostructures by using x-ray mapping in reciprocal space

Journal of Applied Crystallography

Volumn 34, Issue 6, 2001, Pages 715-721

  Shilo, D ^a   Lakin, E ^a   Zolotoyabko, E ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ARTICLE; CRYSTAL STRUCTURE; INTERMETHOD COMPARISON; MEASUREMENT; MECHANICAL STRESS; SPACE; X RAY DIFFRACTION; X RAY MAPPING;

EID: 0035199786     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889801013759     Document Type: Article

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