Comprehensive strain analysis in thin films based on high-resolution x-ray diffraction: Application to implanted LiNbO3

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 20, 2001, Pages

  Shilo, D ^a   Lakin, E ^a   Zolotoyabko, E ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

LITHIUM; NIOBIUM; OXYGEN;

ARTICLE; CHEMICAL STRUCTURE; ELASTICITY; FILM; MOLECULAR PHYSICS; X RAY DIFFRACTION;

EID: 85038972429     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.205420     Document Type: Article

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