Theoretical treatment for scattering scanning near-field optical microscopy

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 14, Issue 11, 1997, Pages 2977-2984

  Xiao, Mufei ^a,b  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^b Institute of Physics UNAM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; DETECTORS; LIGHT SCATTERING; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; OPTICAL FIBER COUPLING; PROBES; RADIATION; SCANNING; SURFACES;

FAR FIELD DETECTORS; SCANNING PROBES; SCATTERING SCANNING NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0031268949     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.14.002977     Document Type: Article

References (27)

1. R. Reddick, R. Warmack, and T. Ferrell, “New form of scan-ning optical microscopy,” Phys. Rev. B 39, 767–770 (1989).
2. E. Betzig and J. K. Trautman, “Near-field optics: microscopy, spectroscopy, and surface modification beyond the diffraction limit,” Science 257, 189–195 (1992).
3. D. W. Pohl and D. Courjon, eds., Near Field Optics (Kluwer, Dordrecht, The Netherlands, 1993).
4. Y. Inouye and S. Kawata, “Near field scanning optical mi-croscope with metallic probe tip,” Opt. Lett. 19, 159–161 (1994).
5. R. Bachelot, P. Gleyzes, and A. C. Boccara, “Near-field optical microscope based on local perturbation of a diffraction spot,” Opt. Lett. 20, 1924–1926 (1995).
6. N. F. van Hulst, M. H. P. Moers, O. F. J. Noordman, R. G. Tack, F. B. Segerink, and B. Bolger, “Near-field optical microscope using a silicon-nitride probe,” Appl. Phys. Lett. 62, 461–463 (1992).
7. F. Zenhauserm, M. P. O’Boyle, and H. K. Wickramasinghe, “Apertureless near-field optical microscope,” Appl. Phys. Lett. 65, 1623–1625 (1994).
8. S. Akamine and H. Kuwano, “Scanning near-field optical microscope using an atomic force microscope cantilever with integrated photodiode,” Appl. Phys. Lett. 68, 579–581 (1995).
9. A. Kawata, Y. Inouye, and T. Sugiura, “Near-field scanning optical microscope with a laser trapped probe,” Jpn. J. Appl. Phys., Part 2 33, L1725-L1727 (1994).
10. M. Xiao, “A study of resolution limit in optical microscopy: near and far field,” Opt. Commun. 132, 403–409 (1996).
11. M. Specht, J. D. Pedarnig, W. M. Heckl, and T. W. Hansch, “Scanning plasmon near-field microscope,” Phys. Rev. Lett. 68, 476–479 (1992).
12. C. Girard, “Plasmon resonances and near-field optical mi-croscopy: a self-consistent theoretical model,” Appl. Opt. 31, 5380–5387 (1992).
13. O. Keller, S. Bozhevolnyi, and M. Xiao, “On the resolution limit of near-field optical microscopy,” in Near Field Optics, D. W. Pohl and D. Courjon, eds. (Kluwer, Dordrecht, The Netherlands, 1993), pp. 229–337.
14. M. Xiao, S. Bozhevolnyi, and O. Keller, “Numerical study of configurational resonances in near-field optical microscopy with a mesoscopic metallic probe,” Appl. Phys. A 62, 115–121 (1996).
15. Y. Martin, F. Zenhausern, and H. K. Wickramasinghe, “Scattering spectroscopy of molecules at nanometer resolu-tion,” Appl. Phys. Lett. 68, 2475–2477 (1996)
16. C. Girard and A. Dereux, “Optical spectroscopy of a surface at the nanometer scale: a theoretical study in real space,” Phys. Rev. B 49, 11344–11351 (1994).
17. N. Garcia and M. Nieto-Vesperinas, “Theory for the aper-tureless near-field optical microscope: image resolution,” Appl. Phys. Lett. 66, 3399–3400 (1995).
18. A. A. Maradudin, A. Mendoza-Suiirez, E. R. Mendez, and M. Nieto-Vesperinas, “A numerical study of a model near field optical microscope,” in Optics at the Nanometer Scale, M. Nieto-Vesperinas and N. Garcia, eds. (Kluwer, Dordrecht, The Netherlands, 1996), pp. 41–61;
19. A. A. Maradudin and E. R. Mendez, “The utility of an impedance boundary condition in the scattering of light from onedimensional randomly rough dielectric surfaces,” Opt. Spectrosc. 80, 409–420 (1996).
20. A. Madrazo and M. Nieto-Vesperinas, “Surface structure and polariton interactions in the scattering of electromag-netic waves from a cylinder in front of a conducting grating: theory for the reflection photon scanning tunneling microscope,” J. Opt. Soc. Am. A 13, 785–797 (1996).
21. S. Wang, M. Xiao, and J. Siqueiros, “A macroscopic ap-proach to near-field optical microscopy,” J. Mod. Opt. 43, 2119–2127 (1996).
22. M. Xiao, P. Negrete-Regagnon, and J. Siqueiros, “Infrared optical gap microscope with far field pickup,” Optik (Stuttgart) 104, 40–41 (1996).
23. O. Keller, M. Xiao, and S. Bozhevolnyi, “Configurational resonances in optical near-field microscopy: a rigorous point-dipole approach,” Surf. Sci. 280, 217–230 (1993).
24. P. B. Johnson and R. W. Christy, “Optical constants of the noble metals,” Phys. Rev. B 6, 4370–4379 (1972).
25. O. Keller, “Screened electromagnetic propagators in nonlocal metal optics,” Phys. Rev. B 34, 3883–3899 (1986).
26. J. E. Sipe, “New Green-function formalism for surface optics,” J. Opt. Soc. Am. B 4, 481–489 (1987).
27. M. Xiao, A. Zayats, and J. Siqueiros, “Scattering of surface-plasmon polaritons by dipoles near a surface: optical nearfield localization,” Phys. Rev. B 55, 1824–1837 (1997).