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Integrated Ferroelectrics

Volumn 33, Issue 1-4, 2001, Pages 379-388

The resistance degradation of (Ba0.5Sr0.5)TiO3 thin films

(5) Yan, F a Bao, P a Chen, X B a Zhu, J S a Wang, Y N a

a NANJING UNIVERSITY (China)

Author keywords

Dielectric properties; Leakage current; Schottky barrier; Thin films

Indexed keywords

BARIUM COMPOUNDS; DIELECTRIC PROPERTIES OF SOLIDS; ELECTRIC FIELD EFFECTS; ELECTRODES; FILM PREPARATION; INTERFACES (MATERIALS); LEAKAGE CURRENTS; PULSED LASER DEPOSITION; SCHOTTKY BARRIER DIODES;

BARIUM STRONTIUM TITANATE; RESISTANCE DEGRADATION;

THIN FILMS;

EID: 0035027164 PISSN: 10584587 EISSN: None Source Type: Journal
DOI: 10.1080/10584580108222320 Document Type: Conference Paper

Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.