Statistical modeling of device characteristics with systematic variability

IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

Volumn E84-A, Issue 2, 2001, Pages 529-536

  Okada, Kenichi ^a   Onodera, Hidetoshi ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

MOSFET; Stochastic; Systematic; Variability

Indexed keywords

CMOS INTEGRATED CIRCUITS; MATHEMATICAL MODELS; MOSFET DEVICES; NETWORK COMPONENTS; STATISTICAL METHODS;

LOCAL STOCHASTIC VARIABILITY;

WSI CIRCUITS;

EID: 0034824848     PISSN: 09168508     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

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