Mismatch characterization of small size MOS transistors

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1995, Pages 271-276

  Bastos, J ^a   Steyaert, M ^a   Roovers, R ^a   Kinget, P ^a   Sansen, W ^a   Graindourze, B ^a   Pergoot, A ^a   Janssens, Er ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CORRELATION METHODS; ELECTRIC CURRENTS; ELECTRIC VARIABLES MEASUREMENT; GATES (TRANSISTOR); MEASUREMENT ERRORS; MOS DEVICES; SEMICONDUCTOR DEVICE MODELS;

CMOS TECHNOLOGY; DC REPEATABILITY; TEST CHIP; THRESHOLD VOLTAGE MISMATCH LINEAR DEPENDENCY; TRANSISTOR DRAIN CURRENT; TRANSISTOR MISMATCH;

TRANSISTORS;

EID: 0029229608     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)