Statistical circuit characterization for deep-submicron CMOS designs

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 1998, Pages 90-91

  Chen, James ^a   Orshansky, Michael ^a   Hu, Chenming ^a   Wan, C P ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL MODELS; MONTE CARLO METHODS; MOSFET DEVICES;

PRINCIPAL COMPONENT ANALYSIS; SOFTWARE PACKAGE SPICE;

CMOS INTEGRATED CIRCUITS;

EID: 0031707669     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)