Measurement and modeling of MOS transistor current mismatch in analog IC's

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn , Issue , 1994, Pages 272-277

  Felt, Eric ^a   Narayan, Amit ^a   Sangiovanni Vincentelli, Alberto ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; ELECTRIC CURRENT MEASUREMENT; ELECTRIC CURRENTS; INTEGRATED CIRCUIT LAYOUT; LINEAR INTEGRATED CIRCUITS; NETWORK COMPONENTS; SEMICONDUCTOR DEVICE MODELS;

ANALOG INTEGRATED CIRCUITS; CURRENT MISMATCH;

MOSFET DEVICES;

EID: 0028714919     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)