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Volumn 62, Issue 23, 2000, Pages 15888-15902

Noise-induced leakage and counting errors in the electron pump

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; COMPUTER SIMULATION; ELECTRON; HEAT TREATMENT; MICROWAVE RADIATION; NOISE; PHOTON; SEMICONDUCTOR; SPECTRUM; TEMPERATURE;

EID: 0034670795     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.62.15888     Document Type: Article
Times cited : (33)

References (50)
  • 27
    • 16444386948 scopus 로고
    • (1994) Physica B , vol.194-196 , pp. 1045
  • 40
    • 33744555846 scopus 로고
    • Ph.D. thesis, University of Paris 6
    • (1991)
    • Pothier, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.