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Volumn 46, Issue 2, 1997, Pages 307-310

A seven-junction electron pump: Design, fabrication, and operation

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; COMPUTER AIDED ANALYSIS; ELECTRIC CHARGE; SEMICONDUCTOR DEVICE MANUFACTURE; STANDARDS; TUNING; TUNNEL JUNCTIONS; VOLTAGE MEASUREMENT;

EID: 0031119267     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.571841     Document Type: Article
Times cited : (33)

References (12)
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    • H. Grabert and M. H. Devoret, Eds. New York: Plenum
    • For a review of Coulomb blockade effects and devices, see Single Charge Tunneling, H. Grabert and M. H. Devoret, Eds. New York: Plenum, 1992.
    • (1992) Single Charge Tunneling
  • 3
    • 0026834525 scopus 로고
    • Measuring the electron's charge and the fine-structure constant by counting electrons on a capacitor
    • Mar.-Apr.
    • E. R. Williams, R. N. Ghosh, and J. M. Martinis, "Measuring the electron's charge and the fine-structure constant by counting electrons on a capacitor," J. Res. Natl. Inst. Stand. Tech., vol. 97, pp. 299-304, Mar.-Apr. 1992.
    • (1992) J. Res. Natl. Inst. Stand. Tech. , vol.97 , pp. 299-304
    • Williams, E.R.1    Ghosh, R.N.2    Martinis, J.M.3
  • 5
    • 0030270303 scopus 로고    scopus 로고
    • Capacitors with very low loss: Cryogenic vacuumgap capacitors
    • N. M. Zimmerman, "Capacitors with very low loss: Cryogenic vacuumgap capacitors," IEEE Trans. Instrum. Meas., vol. 45, pp. 841-846, 1996.
    • (1996) IEEE Trans. Instrum. Meas. , vol.45 , pp. 841-846
    • Zimmerman, N.M.1
  • 6
    • 0000223021 scopus 로고
    • Metrological accuracy of the electron pump
    • J. M. Martinis, M. Nahum, and H. D. Jensen, "Metrological accuracy of the electron pump," Phys. Rev. Lett., vol. 72, pp. 904-907, 1994.
    • (1994) Phys. Rev. Lett. , vol.72 , pp. 904-907
    • Martinis, J.M.1    Nahum, M.2    Jensen, H.D.3
  • 7
  • 8
    • 21544444472 scopus 로고
    • Offset masks for lift-off photoprocessing
    • G. J. Dolan, "Offset masks for lift-off photoprocessing," Appl. Phys. Lett., vol. 31, pp. 337-339, 1977.
    • (1977) Appl. Phys. Lett. , vol.31 , pp. 337-339
    • Dolan, G.J.1
  • 9
    • 0001918954 scopus 로고
    • Fabrication and characterization of single-electron transistors and traps
    • Nov.-Dec.
    • L. Ji, P. D. Dresselhaus, S. Han, K. Lin, W. Zheng, and J. E. Lukens, "Fabrication and characterization of single-electron transistors and traps," J. Vac. Sci. Technol. B, vol. 12, pp. 3619-3622, Nov.-Dec. 1994.
    • (1994) J. Vac. Sci. Technol. B , vol.12 , pp. 3619-3622
    • Ji, L.1    Dresselhaus, P.D.2    Han, S.3    Lin, K.4    Zheng, W.5    Lukens, J.E.6
  • 10
    • 16844373573 scopus 로고
    • Experimental tests for the quantum behavior of a macroscopic degree of freedom: The phase difference across a Josephson junction
    • J. M. Martinis, M. H. Devoret, and J. Clarke, "Experimental tests for the quantum behavior of a macroscopic degree of freedom: The phase difference across a Josephson junction," Phys. Rev. B, vol. 35, pp. 4682-4698, 1987.
    • (1987) Phys. Rev. B , vol.35 , pp. 4682-4698
    • Martinis, J.M.1    Devoret, M.H.2    Clarke, J.3
  • 11
    • 33747959896 scopus 로고    scopus 로고
    • We have developed an algorithm for adjustment of the gains that is straightforward to execute but difficult to explain briefly. The algorithm and the circuit used to implement it can be obtained by contacting the authors
    • We have developed an algorithm for adjustment of the gains that is straightforward to execute but difficult to explain briefly. The algorithm and the circuit used to implement it can be obtained by contacting the authors.
  • 12
    • 0031119210 scopus 로고    scopus 로고
    • Recent results and future challenges for the NIST charged-capacitor experiment
    • Apr.
    • N. M. Zimmerman, J. L. Cobb, and A. F. Clark, "Recent results and future challenges for the NIST charged-capacitor experiment," IEEE Trans. Instrum. Meas., vol. 46, Apr. 1996.
    • (1996) IEEE Trans. Instrum. Meas. , vol.46
    • Zimmerman, N.M.1    Cobb, J.L.2    Clark, A.F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.