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1
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84956087854
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Single-electron pump based on charging effects
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H. Pothier, P. Lafarge, C. Urbina, D. Esteve, and M. H. Devoret, "Single-electron pump based on charging effects," Europhys. Lett., vol. 17, pp. 249-254, 1992.
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Europhys. Lett.
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Pothier, H.1
Lafarge, P.2
Urbina, C.3
Esteve, D.4
Devoret, M.H.5
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2
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0003423226
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H. Grabert and M. H. Devoret, Eds. New York: Plenum
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For a review of Coulomb blockade effects and devices, see Single Charge Tunneling, H. Grabert and M. H. Devoret, Eds. New York: Plenum, 1992.
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(1992)
Single Charge Tunneling
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3
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0026834525
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Measuring the electron's charge and the fine-structure constant by counting electrons on a capacitor
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Mar.-Apr.
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E. R. Williams, R. N. Ghosh, and J. M. Martinis, "Measuring the electron's charge and the fine-structure constant by counting electrons on a capacitor," J. Res. Natl. Inst. Stand. Tech., vol. 97, pp. 299-304, Mar.-Apr. 1992.
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(1992)
J. Res. Natl. Inst. Stand. Tech.
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Williams, E.R.1
Ghosh, R.N.2
Martinis, J.M.3
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4
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36449009280
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Application of single electron tunneling: Precision capacitance ratio measurements
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A. F. Clark, N. M. Zimmerman, E. R. Williams, A. Amar, D. Song, F. C. Wellstood, C. J. Lobb, and R. J. Soulen, "Application of single electron tunneling: Precision capacitance ratio measurements," Appl. Phys. Lett., vol. 66, pp. 2588-2590, 1995.
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(1995)
Appl. Phys. Lett.
, vol.66
, pp. 2588-2590
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Clark, A.F.1
Zimmerman, N.M.2
Williams, E.R.3
Amar, A.4
Song, D.5
Wellstood, F.C.6
Lobb, C.J.7
Soulen, R.J.8
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5
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0030270303
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Capacitors with very low loss: Cryogenic vacuumgap capacitors
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N. M. Zimmerman, "Capacitors with very low loss: Cryogenic vacuumgap capacitors," IEEE Trans. Instrum. Meas., vol. 45, pp. 841-846, 1996.
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(1996)
IEEE Trans. Instrum. Meas.
, vol.45
, pp. 841-846
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Zimmerman, N.M.1
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6
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0000223021
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Metrological accuracy of the electron pump
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J. M. Martinis, M. Nahum, and H. D. Jensen, "Metrological accuracy of the electron pump," Phys. Rev. Lett., vol. 72, pp. 904-907, 1994.
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(1994)
Phys. Rev. Lett.
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Martinis, J.M.1
Nahum, M.2
Jensen, H.D.3
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7
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0000764282
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Accuracy of electron counting using a 7-junction electron pump
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M. W. Keller, J. M. Martinis, N. M. Zimmerman, and A. H. Steinbach, "Accuracy of electron counting using a 7-junction electron pump," Appl. Phys. Lett., vol. 69, pp. 1804-1806, 1996.
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(1996)
Appl. Phys. Lett.
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, pp. 1804-1806
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Keller, M.W.1
Martinis, J.M.2
Zimmerman, N.M.3
Steinbach, A.H.4
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8
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21544444472
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Offset masks for lift-off photoprocessing
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G. J. Dolan, "Offset masks for lift-off photoprocessing," Appl. Phys. Lett., vol. 31, pp. 337-339, 1977.
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(1977)
Appl. Phys. Lett.
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Dolan, G.J.1
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9
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0001918954
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Fabrication and characterization of single-electron transistors and traps
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Nov.-Dec.
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L. Ji, P. D. Dresselhaus, S. Han, K. Lin, W. Zheng, and J. E. Lukens, "Fabrication and characterization of single-electron transistors and traps," J. Vac. Sci. Technol. B, vol. 12, pp. 3619-3622, Nov.-Dec. 1994.
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(1994)
J. Vac. Sci. Technol. B
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Ji, L.1
Dresselhaus, P.D.2
Han, S.3
Lin, K.4
Zheng, W.5
Lukens, J.E.6
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10
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16844373573
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Experimental tests for the quantum behavior of a macroscopic degree of freedom: The phase difference across a Josephson junction
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J. M. Martinis, M. H. Devoret, and J. Clarke, "Experimental tests for the quantum behavior of a macroscopic degree of freedom: The phase difference across a Josephson junction," Phys. Rev. B, vol. 35, pp. 4682-4698, 1987.
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(1987)
Phys. Rev. B
, vol.35
, pp. 4682-4698
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Martinis, J.M.1
Devoret, M.H.2
Clarke, J.3
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11
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33747959896
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We have developed an algorithm for adjustment of the gains that is straightforward to execute but difficult to explain briefly. The algorithm and the circuit used to implement it can be obtained by contacting the authors
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We have developed an algorithm for adjustment of the gains that is straightforward to execute but difficult to explain briefly. The algorithm and the circuit used to implement it can be obtained by contacting the authors.
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12
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0031119210
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Recent results and future challenges for the NIST charged-capacitor experiment
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Apr.
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N. M. Zimmerman, J. L. Cobb, and A. F. Clark, "Recent results and future challenges for the NIST charged-capacitor experiment," IEEE Trans. Instrum. Meas., vol. 46, Apr. 1996.
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(1996)
IEEE Trans. Instrum. Meas.
, vol.46
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Zimmerman, N.M.1
Cobb, J.L.2
Clark, A.F.3
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