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Volumn 86, Issue 5, 1999, Pages 2684-2686

Noise of a single electron transistor on a Si3N4 membrane

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0005033725     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371110     Document Type: Article
Times cited : (7)

References (19)
  • 1
    • 0000113067 scopus 로고
    • edited by B. Altschuler, P. Lee, and R. Webb Elsevier Science, Amsterdam
    • D. V. Averin and K. K. Likharev, in Mesoscopic Phenomena in Solids, edited by B. Altschuler, P. Lee, and R. Webb (Elsevier Science, Amsterdam, 1991), p. 173.
    • (1991) Mesoscopic Phenomena in Solids , pp. 173
    • Averin, D.V.1    Likharev, K.K.2
  • 2
    • 0042145686 scopus 로고    scopus 로고
    • edited by J. Jortner and M. A. Ratner Blackwell, Oxford
    • A. N. Korotkov, in Molecular Electronics, edited by J. Jortner and M. A. Ratner (Blackwell, Oxford, 1997), p. 157.
    • (1997) Molecular Electronics , pp. 157
    • Korotkov, A.N.1
  • 12
    • 85034552972 scopus 로고    scopus 로고
    • B. Starmark, T. Henning, T. Claeson, P. Delsing, and A. N. Korotkov, cond-mat/9806354
    • B. Starmark, T. Henning, T. Claeson, P. Delsing, and A. N. Korotkov, cond-mat/9806354.
  • 17
    • 85034548969 scopus 로고    scopus 로고
    • note
    • TMAH would have been a safer choice for etching as pointed out by the referee.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.