Scanning force microscopy investigation of liquid structures and its application to fundamental wetting research

Journal of Adhesion Science and Technology

Volumn 14, Issue 14, 2000, Pages 1767-1782

  Herminghaus, S ^a   Pompe, T ^b   Fery, A ^b  

^a UNIVERSITY OF ULM   (Germany)

^b MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

Author keywords

line tension; Scanning force microscopy; wetting

Indexed keywords

COMPLEMENTARY METHODS; CONTACT LINES; INTERFACE POTENTIALS; LINE TENSION; LIQUID STRUCTURES; TAPPING MODES;

ATOMIC FORCE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; WETTING; INTERFACES (MATERIALS); MICROSCOPIC EXAMINATION; MORPHOLOGY; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; STRUCTURE (COMPOSITION); SURFACE TOPOGRAPHY;

LIQUIDS;

CONTACT LINE TENSION; LIQUID STRUCTURES; LIQUID TOPOGRAPHY; SCANNING FORCE MICROSCOPY; TAPPING MODE;

EID: 0034456051     PISSN: 01694243     EISSN: 15685616     Source Type: Journal    
DOI: 10.1163/156856100743220     Document Type: Article

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