-
1
-
-
0030084942
-
-
32, p. 491, 1996.
-
G. Yusa and H. Sakaki, "GaAs/n-AlGaAs field-effect transistor with embedded InAs quantum traps and its programable threshold characteristics," Electron. Lett., vol. 32, p. 491, 1996.
-
"GaAs/n-AlGaAs Field-effect Transistor with Embedded InAs Quantum Traps and Its Programable Threshold Characteristics," Electron. Lett., Vol.
-
-
Yusa, G.1
Sakaki, H.2
-
3
-
-
0000298224
-
-
68, p. 1377, 1996.
-
S. Tiwari et al., "A silicon nanocrystals based memory," Appl. Phys. Lett., vol. 68, p. 1377, 1996.
-
"A Silicon Nanocrystals Based Memory," Appl. Phys. Lett., Vol.
-
-
Tiwari, S.1
-
4
-
-
0030241362
-
-
43, p. 1553, 1996.
-
H. I. Hanafi et al., "Fast and long retention-time nano-crystal memory," IEEE Trans. Electron Devices, vol. 43, p. 1553, 1996.
-
"Fast and Long Retention-time Nano-crystal Memory," IEEE Trans. Electron Devices, Vol.
-
-
Hanafi, H.I.1
-
5
-
-
0028514569
-
-
41, p. 1628, 1994.
-
K. Yano, "Room-temperature single-electron memory," IEEE Trans. Electron Devices, vol. 41, p. 1628, 1994.
-
"Room-temperature Single-electron Memory," IEEE Trans. Electron Devices, Vol.
-
-
Yano, K.1
-
6
-
-
0001551483
-
-
70, p. 1742, 1997.
-
A. Nakajima et al, "Room temperature operation of Si single-electron memory with self-aligned floating dot gate," Appl. Phys. Lett., vol. 70, p. 1742, 1997.
-
"Room Temperature Operation of Si Single-electron Memory with Self-aligned Floating Dot Gate," Appl. Phys. Lett., Vol.
-
-
Nakajima, A.1
-
7
-
-
0031039096
-
-
"A silicon single-electron transistor memory operating at room temperature, 275, p. 649, 1997.
-
L. Guo, "A silicon single-electron transistor memory operating at room temperature," Science, vol. 275, p. 649, 1997.
-
" Science, Vol.
-
-
Guo, L.1
-
8
-
-
0031167986
-
-
18, p. 278, 1997.
-
J. J. Welser et al., "Room temperature operation of a quantum-dot flash memory," IEEE Electron Device Lett., vol. 18, p. 278, 1997.
-
"Room Temperature Operation of A Quantum-dot Flash Memory," IEEE Electron Device Lett., Vol.
-
-
Welser, J.J.1
-
9
-
-
0042235931
-
-
67, pp. 256-, 1995.
-
Y. Sugiyama et al., "Novel InGaAs/GaAs quantum dot structures formed in tetrahedral-shaped recesses on (111)B GaAs substrate using metalorganic vapor phase epitaxy"," Appl. Phys. Lett., vol. 67, pp. 256-, 1995.
-
"Novel InGaAs/GaAs Quantum Dot Structures Formed in Tetrahedral-shaped Recesses on (111)B GaAs Substrate Using Metalorganic Vapor Phase Epitaxy"," Appl. Phys. Lett., Vol.
-
-
Sugiyama, Y.1
-
11
-
-
0032120840
-
-
42, p. 1341, 1998.
-
Y. Sakuma et al., "Magneto-photoluminescence study of quantum dots formed on tetrahedral-shaped recesses," Solid-State Electron., vol. 42, p. 1341, 1998.
-
"Magneto-photoluminescence Study of Quantum Dots Formed on Tetrahedral-shaped Recesses," Solid-State Electron., Vol.
-
-
Sakuma, Y.1
-
13
-
-
0024103911
-
-
93, p. 120, 1988.
-
R. M. Lum et al., "13C isotopic labeling studies of growth mechanisms in the metalorganic vapor phase epitaxy of GaAs," J. Cryst. Growth, vol. 93, p. 120, 1988.
-
"13C Isotopic Labeling Studies of Growth Mechanisms in the Metalorganic Vapor Phase Epitaxy of GaAs," J. Cryst. Growth, Vol.
-
-
Lum, R.M.1
-
14
-
-
0028762064
-
-
145, p. 390, 1994.
-
M. Kondo et al., "Dependence of carbon incorporation on crystallographic orientation during metalorganic vapor phase epitaxy of GaAs and AlGaAs," J. Cryst. Growth, vol. 145, p. 390, 1994.
-
"Dependence of Carbon Incorporation on Crystallographic Orientation during Metalorganic Vapor Phase Epitaxy of GaAs and AlGaAs," J. Cryst. Growth, Vol.
-
-
Kondo, M.1
-
15
-
-
35949025938
-
-
52, p. 228, 1984.
-
K. S. Rails et al, "Discrete resistance switching in submicrometer silicon inversion layers: Individual interface traps and low-frequency (1/0 noise," Phys. Rev. Lett., vol. 52, p. 228, 1984.
-
"Discrete Resistance Switching in Submicrometer Silicon Inversion Layers: Individual Interface Traps and Low-frequency 1/0 Noise," Phys. Rev. Lett., Vol.
-
-
Rails, K.S.1
-
16
-
-
0001702446
-
-
4, p. 1116, 989.
-
M. J. Kirton et al, "Individual defects at the Si: SiO2 interface," Semiconduct. Sci. Technol, vol. 4, p. 1116, 989.
-
"Individual Defects at the Si: SiO2 Interface," Semiconduct. Sci. Technol, Vol.
-
-
Kirton, M.J.1
-
17
-
-
0030082969
-
-
35, p. 826, 1996.
-
J.-Q. Lu étal., "Random telegraph noise in advanced self-aligned bipolar transistors," Jpn. J. Appl. Phys., vol. 35, p. 826, 1996.
-
"Random Telegraph Noise in Advanced Self-aligned Bipolar Transistors," Jpn. J. Appl. Phys., Vol.
-
-
Lu Étal, J.-Q.1
|