Manufacturability and robust design of nanoelectronic logic circuits based on resonant tunnelling diodes

International Journal of Circuit Theory and Applications

Volumn 28, Issue 6, 2000, Pages 537-552

  Prost, W ^a   Auer, U ^a   Tegude, F J ^a   Pacha, C ^b   Goser, K F ^b   Janssen, G ^c   Van Der Roer, T ^c  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b TU DORTMUND UNIVERSITY   (Germany)

^c EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Manufacturability; Nanoelectronic logic circuits; Resonant tunnelling diodes; Robust design

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC NETWORK PARAMETERS; LOGIC CIRCUITS; NANOTECHNOLOGY; RESONANT TUNNELING; SENSITIVITY ANALYSIS; THRESHOLD LOGIC;

NANOELECTRONIC LOGIC CIRCUITS; QUANTUM TUNNELING DEVICES; RESONANT TUNNELING DIODES;

ELECTRIC NETWORK SYNTHESIS;

EID: 0034311904     PISSN: 00989886     EISSN: None     Source Type: Journal    
DOI: 10.1002/1097-007X(200011/12)28:6<537::AID-CTA126>3.0.CO;2-B     Document Type: Article

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