Polarization of silicon detectors by minimum ionizing particles

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 452, Issue 3, 2000, Pages 440-453

  Dezillie, B ^a   Eremin, V ^b   Li, Z ^a   Verbitskaya, E ^b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRIC CURRENTS; ELECTRIC FIELDS; INFRARED DEVICES; LASER APPLICATIONS; MATHEMATICAL MODELS; POLARIZATION; SEMICONDUCTOR DEVICES; SILICON SENSORS;

SEMICONDUCTOR DETECTORS;

PARTICLE DETECTORS;

EID: 0034300670     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)00450-2     Document Type: Article

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