Temperature-stimulated abnormal annealing of neutron-induced damage in high-resistivity silicon detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 385, Issue 2, 1997, Pages 321-329

  Li, Z ^a   Li, C J ^a,c   Verbitskaya, E ^b   Eremin, V ^b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b IOFFE INSTITUTE   (Russian Federation)

^c INSTITUTE OF SEMICONDUCTORS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHARGE CARRIERS; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRIC CURRENT MEASUREMENT; ELECTRIC SPACE CHARGE; LASER APPLICATIONS; NEUTRON IRRADIATION; RADIATION DAMAGE;

ABNORMAL ANNEALING; ELEVATED TEMPERATURE ANNEALING; HIGH RESISTIVITY SILICON DETECTORS; THERMALLY STIMULATED CURRENT;

RADIATION DETECTORS;

EID: 0030736551     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)01146-1     Document Type: Article

References (29)

1. H.J. Ziock, J.G. Boissevain, K. Holzscheiter, J.S. Kapustinsky, A.P.T. Palounek, W.E. Sondheim, E. Barberis, N. Cartiglia, J. Leslie, D. Pitzl, W.A. Rowe, M.F.W. Sadrozinski, A. Seiden, E. Spencer, J. a. Ellison, J.K. Fleming, S. Jerger, D. Joyce, C. Lietzke, E. Reed, S.J. Wimpenny, P. Ferguson, M.A. Frantschi, J.A.J. Matthews and D. Skinner, IEEE Trans. Nucl. Sci. 40 (1993) 344.
2. T. Schulz, H. Feick, E. Fretwurst, G. Lindstroem, M. Moll and K.H. Mahlmann, presented at the IEEE Nuclear Science Symp., San Francisco, CA, Nov. 2-5, 1993, I EEE Trans. Nucl. Sci. 41 (1994) 791.
3. T. Schulz, H. Feick, E. Fretwurst, G. Lindstroem, M. Moll and K.H. Mahlmann, presented at the IEEE Nuclear Science Symp., San Francisco, CA, Nov. 2-5, 1993, I EEE Trans. Nucl. Sci. 41 (1994) 791.
4. Z. Li, Proc. Int. Symp. on Development and Application of Semiconductor Tracking Detectors, Hiroshima, Japan, May 22-24, 1993, Nucl. Instr. and Meth. A 342 (1994) 105.
5. Z. Li, Proc. Int. Symp. on Development and Application of Semiconductor Tracking Detectors, Hiroshima, Japan, May 22-24, 1993, Nucl. Instr. and Meth. A 342 (1994) 105.
6. E. Fretwurst, H. Feick, M. Glaser, C. Gobling, E.H.M. Heijine, A. Hess, F. Lemeilleur, G. Lindstroem, K.H. Mahlmann, A. Rolf, T. Schulz and C. Soave, Int. Symp. on Development and Application of Semiconductor Tracking Detectors, Hiroshima, Japan, May 22-24, 1993, Nucl. Instr. and Meth. A 342 (1994) 119.
7. E. Fretwurst, H. Feick, M. Glaser, C. Gobling, E.H.M. Heijine, A. Hess, F. Lemeilleur, G. Lindstroem, K.H. Mahlmann, A. Rolf, T. Schulz and C. Soave, Int. Symp. on Development and Application of Semiconductor Tracking Detectors, Hiroshima, Japan, May 22-24, 1993, Nucl. Instr. and Meth. A 342 (1994) 119.
8. C.J. Li and Z. Li, Nucl. Instr. and Meth. A 342 (1994) 137.
9. Z. Li, C.J. Li, V. Eremin and E. Verbitskaya, Nucl. Instr. and Meth. A 377 (1996) 265.
10. C.J. Li and Z. Li, Nucl. Instr. and Meth. A 364 (1995) 108.
11. E. Borchi, M. Bruzzi and M.S. Mazzoni, Nucl. Instr. and Meth. A 310 (1991) 273.
12. A. Baldini and M. Bruzzi, Rev. Sci. Instr. 64 (1993) 932.
13. U. Biggeri, E. Borchi, M. Bruzzi, S. Lazanu, Z. Li and S. Lazanu, IEEE Trans. Nucl. Sci. 41 (1994) 964.
14. V. Eremin, N. Strokan, E. Verbitskaya and Z. Li, Nucl. Instr. and Meth. A 372 (1996) 388.
15. Z. Li and H.W. Kraner, Proc. 3rd Int. Conf. on Advanced Technology and Particle Physics, Como, Italy, 22-26 June 1992, Nucl. Phys. B 32 (1993) 398.
16. Z. Li and H.W. Kraner, Proc. 3rd Int. Conf. on Advanced Technology and Particle Physics, Como, Italy, 22-26 June 1992, Nucl. Phys. B 32 (1993) 398.
17. Z. Li, W. Chen, L. Dou, V. Eremin, H.W. Kraner, C.J. Li, G. Lindstroem and E. Spiriti, IEEE Trans. Nucl. Sci. 42 (1995) 219.
18. M. Moll, H. Feick, E. Fretwurst, G. Lindstroem and T. Schulz, Nucl. Phys. B 44 (1995) 468.
19. Z. Li, IEEE Trans. Nucl. Sci. 42 (1995) 224.
20. V. Eremin and Z. Li, BNL-60072, Proc. IEEE Nuclear and Space Radiation Effects Conf., Tucson, Arizona, July 18-22, 1994, IEEE Trans. Nucl. Sci. 41 (1994) 1907.
21. V. Eremin and Z. Li, BNL-60072, Proc. IEEE Nuclear and Space Radiation Effects Conf., Tucson, Arizona, July 18-22, 1994, IEEE Trans. Nucl. Sci. 41 (1994) 1907.
22. S.M. Sze, Physics of Semiconductor Devices, 2nd Edition, Taipei (Wiley, 1983) pp. 77-81.
23. Z. Li, Proc. Italian Physical Society Conf., Vol. 46, Large Scale Applications and Radiation Hardness of Semiconductor Detectors, eds. A. Baldini and E. Focardi (SIF, Bologna, 1994) p. 101.
24. Z. Li, Nucl. Instr. and Meth. A 368 (1995) 353.
25. B. Schmidt, V. Eremin, A. Ivanov, N. Strokan, E. Verbitskaya and Z. Li, J. Appl. Phys. 76 (1994) 4072.
26. B.C. MacEvoy, G. Hall and K. Gill, Nucl. Instr. and Meth. A 374 (1996) 12.
27. M. Bruzzi, Nucl. Instr. and Meth. A 352 (1995) 618.
28. Z. Li, G. Ghislotti, H.W. Kraner, C.J. Li, B. Nielson, H. Feick and G. Lindstroem, IEEE Trans. Nucl. Sci. 43 (June 1996) 1590.
29. C.T. Sah, L. Forbes, L.L. Rosier and A.F. Tasch, Jr., Solid State Electron. 13 (1970) 759.