Simulated noncontact atomic force microscopy images of Si(001) surface with silicon tip

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 10, 2000, Pages 6025-6028

  Tagami, Katsunori ^a   Tsukada, Masaru ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; CHEMICAL BONDS; COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; DIMERS; IMAGE ANALYSIS; INTEGRATION; MATHEMATICAL MODELS; SURFACES;

NONCONTACT ATOMIC FORCE MICROSCOPY; SILICON TIP; TIGHT BINDING MODEL;

SEMICONDUCTING SILICON;

EID: 0034291209     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.6025     Document Type: Article

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