Reflection high-energy electron diffraction and scanning tunneling microscopy study of InP(001) surface reconstructions

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 18, Issue 4, 2000, Pages 1492-1496

  LaBella, V P ^a   Ding, Z ^a   Bullock, D W ^a   Emery, C ^a   Thibado, P M ^a  

^a UNIVERSITY OF ARKANSAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR GROWTH; SURFACE PHENOMENA; THERMAL EFFECTS;

SURFACE RECONSTRUCTION;

SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 0034227658     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.582373     Document Type: Article

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