Enabling in situ atomic-scale characterization of epitaxial surfaces and interfaces

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 6, 1998, Pages 3112-3114

  Smathers, J B ^a   Bullock, D W ^a   Ding, Z ^a   Salamo, G J ^a   Thibado, P M ^a   Gerace, B ^b   Wirth, W ^c  

^a UNIVERSITY OF ARKANSAS   (United States)

^b Omicron Associates   (United States)

^c Omicron Vakuumphysik   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001084742     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.590496     Document Type: Article

References (8)

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6. P. M. Thibado, B. R. Bennett, M. E. Twigg, B. V. Shanabrook, and L. J. Whitman, J. Vac. Sci. Technol. A 14, 885 (1996).
7. STM II, Omicron Associates, Denver, CO 80209.
8. Riber 32P, Riber, Inc., France.