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Volumn 14, Issue 3, 1996, Pages 1115-1123

Ion implantation for silicon device manufacturing: A vacuum perspective

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EID: 0000697516     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580279     Document Type: Article
Times cited : (16)

References (35)
  • 1
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    • Semiconductor Industry Association Technology Roadmap for Semiconductors, San Jose, CA, 1994 (unpublished)
    • Semiconductor Industry Association Technology Roadmap for Semiconductors, San Jose, CA, 1994 (unpublished).
  • 3
    • 85033864050 scopus 로고
    • See for example, the conference series, Ion Implantation Technology (earlier known as Ion Implantation Equipment and Techniques), with partial publication coverage in Nucl. Instrum. Methods 189 (1981); Nucl. Instrum. Methods B 6, (1985); ibid. 21 (1987); ibid. 37/38 (1989); ibid. 55 (1991); ibid. 74 (1993); ibid. 96 (1995).
    • (1981) Nucl. Instrum. Methods , vol.189
  • 4
    • 5844424498 scopus 로고
    • See for example, the conference series, Ion Implantation Technology (earlier known as Ion Implantation Equipment and Techniques), with partial publication coverage in Nucl. Instrum. Methods 189 (1981); Nucl. Instrum. Methods B 6, (1985); ibid. 21 (1987); ibid. 37/38 (1989); ibid. 55 (1991); ibid. 74 (1993); ibid. 96 (1995).
    • (1985) Nucl. Instrum. Methods B , vol.6
  • 5
    • 5844369407 scopus 로고
    • See for example, the conference series, Ion Implantation Technology (earlier known as Ion Implantation Equipment and Techniques), with partial publication coverage in Nucl. Instrum. Methods 189 (1981); Nucl. Instrum. Methods B 6, (1985); ibid. 21 (1987); ibid. 37/38 (1989); ibid. 55 (1991); ibid. 74 (1993); ibid. 96 (1995).
    • (1987) Nucl. Instrum. Methods B , vol.21
  • 6
    • 5844372743 scopus 로고
    • See for example, the conference series, Ion Implantation Technology (earlier known as Ion Implantation Equipment and Techniques), with partial publication coverage in Nucl. Instrum. Methods 189 (1981); Nucl. Instrum. Methods B 6, (1985); ibid. 21 (1987); ibid. 37/38 (1989); ibid. 55 (1991); ibid. 74 (1993); ibid. 96 (1995).
    • (1989) Nucl. Instrum. Methods B , vol.37-38
  • 7
    • 5844385303 scopus 로고
    • See for example, the conference series, Ion Implantation Technology (earlier known as Ion Implantation Equipment and Techniques), with partial publication coverage in Nucl. Instrum. Methods 189 (1981); Nucl. Instrum. Methods B 6, (1985); ibid. 21 (1987); ibid. 37/38 (1989); ibid. 55 (1991); ibid. 74 (1993); ibid. 96 (1995).
    • (1991) Nucl. Instrum. Methods B , vol.55
  • 8
    • 5844326406 scopus 로고
    • See for example, the conference series, Ion Implantation Technology (earlier known as Ion Implantation Equipment and Techniques), with partial publication coverage in Nucl. Instrum. Methods 189 (1981); Nucl. Instrum. Methods B 6, (1985); ibid. 21 (1987); ibid. 37/38 (1989); ibid. 55 (1991); ibid. 74 (1993); ibid. 96 (1995).
    • (1993) Nucl. Instrum. Methods B , vol.74
  • 9
    • 5844412076 scopus 로고
    • See for example, the conference series, Ion Implantation Technology (earlier known as Ion Implantation Equipment and Techniques), with partial publication coverage in Nucl. Instrum. Methods 189 (1981); Nucl. Instrum. Methods B 6, (1985); ibid. 21 (1987); ibid. 37/38 (1989); ibid. 55 (1991); ibid. 74 (1993); ibid. 96 (1995).
    • (1995) Nucl. Instrum. Methods B , vol.96
  • 12
    • 85033861606 scopus 로고    scopus 로고
    • T. C. Smith, in Ref. 5, pp. 555-598
    • T. C. Smith, in Ref. 5, pp. 555-598.
  • 20
    • 5844412074 scopus 로고
    • edited by S. Coffa, G. Ferla, F. Priolo, and E. Rimini Elsevier, New York
    • P. Kellerman and W. Hrynyk, in Ion Implantation Technology-94, edited by S. Coffa, G. Ferla, F. Priolo, and E. Rimini (Elsevier, New York, 1995), pp. 604-607.
    • (1995) Ion Implantation Technology-94 , pp. 604-607
    • Kellerman, P.1    Hrynyk, W.2
  • 23
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    • edited by D. F. Downey, M. Farley, K. S. Jones, and G. Ryding Elsevier, New York
    • R. Riekeles, in Ion Implantation Technology-92, edited by D. F. Downey, M. Farley, K. S. Jones, and G. Ryding (Elsevier, New York, 1993), pp. 551-554.
    • (1993) Ion Implantation Technology-92 , pp. 551-554
    • Riekeles, R.1
  • 27
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    • P. Sferlazzo, D. A. Brown, S. E. Beck, and J. F. O'Hanlon, in Ref. 17, pp. 565-569
    • P. Sferlazzo, D. A. Brown, S. E. Beck, and J. F. O'Hanlon, in Ref. 17, pp. 565-569.
  • 32
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    • J. V. McManus, G. M. Tom, and R. Kirk, in Ref. 14, pp. 523-526
    • J. V. McManus, G. M. Tom, and R. Kirk, in Ref. 14, pp. 523-526.
  • 33
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    • R. B. Liebert, L. Ficarra, R. Eddy, W. Ghen, and P. Lessard, in Ref. 14, pp. 548-552
    • R. B. Liebert, L. Ficarra, R. Eddy, W. Ghen, and P. Lessard, in Ref. 14, pp. 548-552.
  • 34
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    • H. Ryssel, L. Frey, and P. Hamers, in Ref. 5, pp. 435-453
    • H. Ryssel, L. Frey, and P. Hamers, in Ref. 5, pp. 435-453.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.