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Volumn 164, Issue 1-4, 1996, Pages 66-70
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A comparison of RHEED reconstruction phases on (100) InAs, GaAs and InP
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Author keywords
[No Author keywords available]
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Indexed keywords
CALIBRATION;
ELECTRON SPECTROSCOPY;
ENERGY GAP;
PHASE DIAGRAMS;
PHASE TRANSITIONS;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTING INDIUM PHOSPHIDE;
SURFACE STRUCTURE;
TEMPERATURE MEASUREMENT;
EPITAXY MACHINE;
GROWTH PROPERTIES;
PHASE BOUNDARIES;
SURFACE RECONSTRUCTIONS;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
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EID: 0030197082
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-0248(96)00009-7 Document Type: Article |
Times cited : (25)
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References (9)
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