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Volumn 144-145, Issue , 1999, Pages 501-504
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Interaction measurements between a tip and a sample in proximity regions controlled by tunneling current in a UHV STM-AFM
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Author keywords
Atomic force microscopy; Force separation curve; Scanning tunneling microscopy; Silicon
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
NUMERICAL METHODS;
PROBES;
SAMPLING;
SCANNING TUNNELING MICROSCOPY;
SILICON;
SURFACES;
FORCE SEPARATION CURVE;
TUNNELING CURRENT;
ULTRAHIGH VACUUM SCANNING TUNNELING MICROSCOPY;
ELECTRON TUNNELING;
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EID: 0032663602
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(98)00849-6 Document Type: Article |
Times cited : (3)
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References (10)
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