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Volumn 144-145, Issue , 1999, Pages 501-504

Interaction measurements between a tip and a sample in proximity regions controlled by tunneling current in a UHV STM-AFM

Author keywords

Atomic force microscopy; Force separation curve; Scanning tunneling microscopy; Silicon

Indexed keywords

ATOMIC FORCE MICROSCOPY; NUMERICAL METHODS; PROBES; SAMPLING; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACES;

EID: 0032663602     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00849-6     Document Type: Article
Times cited : (3)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.