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Volumn 366, Issue 1-2, 2000, Pages 121-128

Surface structures of silicon nitride thin films on Si(111)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CRYSTALLINE MATERIALS; EPITAXIAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; NITRIDING; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SILICON NITRIDE; SURFACE STRUCTURE;

EID: 0034188155     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00852-X     Document Type: Article
Times cited : (25)

References (33)
  • 15
    • 0002834819 scopus 로고
    • Preparation and Properties of Silicon Nitride Based Materials
    • D.A. Bonnell, & T.Y. Tien. Zürich: Trans Tech Publications
    • Arienzo M., Orr-Arienzo W.A. Bonnell D.A., Tien T.Y. Preparation and Properties of Silicon Nitride Based Materials. Materials Science Forum. 47:1989;228 Trans Tech Publications, Zürich.
    • (1989) Materials Science Forum , vol.47 , pp. 228
    • Arienzo, M.1    Orr-Arienzo, W.A.2
  • 25
    • 0004262438 scopus 로고
    • S. Somiya, M. Mitomo, & M. Yoshimura. London: Elsevier
    • Mitomo M. Somiya S., Mitomo M., Yoshimura M. Silicon Nitride. 1990;Elsevier, London.
    • (1990) Silicon Nitride
    • Mitomo, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.