Another dimension in device characterization: Scanning capacitance microscopy of InP-based laser structures

IEEE Circuits and Devices Magazine

Volumn 16, Issue 2, 2000, Pages 12-18

  Anand, Srinivasan ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

HETEROJUNCTIONS; SEMICONDUCTING INDIUM PHOSPHIDE;

SCANNING CAPACITANCE MICROSCOPY (SCM);

SEMICONDUCTOR LASERS;

EID: 0033905913     PISSN: 87553996     EISSN: None     Source Type: Journal    
DOI: 10.1109/101.833030     Document Type: Article

References (11)

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