Characterization of buried heterostructure lasers by scanning capacitance microscopy

Conference Proceedings - International Conference on Indium Phosphide and Related Materials

Volumn , Issue , 1999, Pages 67-70

  Anand, S ^a   Kallstenius, T ^a   Stoltz, B ^a   Smith, U ^a   Landgren, G ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HETEROJUNCTIONS; SEMICONDUCTING INDIUM PHOSPHIDE;

SCANNING CAPACITANCE MICROSCOPY (SCM);

SEMICONDUCTOR LASERS;

EID: 0032655270     PISSN: 10928669     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)