Implementation and optimization of a scanning Joule expansion microscope for the study of small conducting gold wires

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 308-313

  Cannaerts, M ^a   Seynaeve, E ^a   Rens, G ^a   Volodin, A ^a   Van Haesendonck, C ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONDUCTIVE FILMS; ELECTROSTATICS; MATHEMATICAL MODELS; THERMAL DIFFUSION IN SOLIDS; THERMAL EXPANSION; THIN FILMS; WIRE;

SCANNING JOULE EXPANSION MICROSCOPY (SJEM); SCANNING THERMAL MICROSCOPY (STHM);

GOLD;

EID: 0033734120     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00544-9     Document Type: Article

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