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Volumn 433, Issue , 1999, Pages 486-490

Noncontact UHV-AFM investigations of the growth of C59N films on layered materials

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRONIC PROPERTIES; FILM GROWTH; GRAPHITE; MICA; NUCLEATION; SEMICONDUCTING SELENIUM COMPOUNDS; THERMAL EFFECTS;

HETEROFULLERENES; HIGHLY ORIENTED PYROLYTHIC GRAPHITE; NONCONTACT ULTRAHIGH VACUUM ATOMIC FORCE MICROSCOPY;

FULLERENES;

EID: 0033357325 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(99)00118-1 Document Type: Article

Times cited : (3)

References (12)

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