Accurate structure determinations of very small (4-20 nm) areas, using refinement of dynamic electron diffraction data

Journal of Microscopy

Volumn 190, Issue 1-2, 1998, Pages 222-237

  Zandbergen, H W ^a   Jansen, J ^a,b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

Dynamic diffraction; Electron diffraction; Nanodiffraction; Structure refinement; Superconductors

Indexed keywords

BARIUM COMPOUNDS; BORON COMPOUNDS; CALCIUM COMPOUNDS; CERIUM COMPOUNDS; ELECTRON DIFFRACTION; LANTHANUM COMPOUNDS; NICKEL COMPOUNDS; NITROGEN COMPOUNDS; PHOSPHORUS COMPOUNDS; SUPERCONDUCTING MATERIALS;

ATOMIC POSITIONS; CONVENTIONAL STRUCTURES; DYNAMIC DIFFRACTION; ELECTRON DIFFRACTION DATA; NANODIFFRACTION; POLYPHASE MATERIALS; R VALUE; STRUCTURE DETERMINATION; STRUCTURE REFINEMENTS;

COPPER COMPOUNDS;

ALGORITHM; COMPUTER PROGRAM; DATA ANALYSIS; DIAGNOSTIC ACCURACY; ELECTRON DIFFRACTION; MOLECULAR DYNAMICS; PRIORITY JOURNAL; REVIEW; STRUCTURE ANALYSIS;

EID: 0031943614     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1998.3270880.x     Document Type: Review

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