Does crystal tilt enhance the electron interaction?

Microscopy and Microanalysis

Volumn 4, Issue 4, 1998, Pages 428-434

  Van Dyck, D ^a   Bokel, R M J ^b   Zandbergen, H W ^b  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Adsorbates; Channeling; Crystal misorientation; High resolution electron microscopy; Molecular and ion sputtering; Secondary ion mass spectrometry; SF5+; SIMS; Xe+

Indexed keywords

EID: 0032276166     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927698980412     Document Type: Article

References (6)

1. Bokel RMJ, Jansen J, Zandbergen HW, Van Dyck D (1998) Determining specimen orientation and thickness on a nanometer scale from reconstructed exit waves. In: Proceedings of the 14th International Congress on Electron Microscopy, Cancun, Mexico, Bristol, UK: Institute of Physics Publishing, pp 407-408
2. Coene WMJ, Thust A, Op de Beeck M, Van Dyck D (1996) Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy. Ultramicroscopy 64:109-135
3. O'Keefe MA, Radmilovic V (1994) Specimen thickness is wrong in simulated HRTEM images. In: Proceedings of the 13th International Congress on Electron Microscopy, Paris, France, Les Ulis, France: Les Editions de Physique, pp 361-362
4. Op de Beeck M, Van Dyck D, Coene W (1996) Wave function reconstruction in HRTEM: the parabola method. Ultramicroscopy 64:167-183
5. Van Dyck D (1985) In: Advances in Electrons and Electron Physics, Hawkes PW (ed). San Diego: Academic Press, pp 295-355
6. Van Dyck D, Op de Beeck M (1996) A simple intuitive theory for electron diffraction. Ultramicroscopy 64:99-107